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CD3206BB Ver la hoja de datos (PDF) - Philips Electronics

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Lista de partido
CD3206BB Datasheet PDF : 18 Pages
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Philips Semiconductors
9-bit latched/registered/pass-thru Futurebus+ transceiver
Product specification
FB2031
DC ELECTRICAL CHARACTERISTICS (Commercial)
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
IOH
IOFF
VOH
VOL
VIK
High level output current
Power-off output current
High-level output voltage
Low-level output voltage
Input clamp voltage
B0 – B8
B0 – B8
A0 – A8 4
A0 – A8 4
B0 – B8
Control pins
A0 – A8
B0 – Bn
VCC = MAX, VIL = MAX, VIH = MIN, VOH = 1.9V
VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 1.9V
VCC = MIN, VIL = MAX, VIH = MIN, IOH = -24mA
VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 80mA
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 4mA
VCC = MIN, II = IIK
VCC = MIN, II = -18mA
100
µA
100
µA
2.0
V
2.5 2.85
0.5
.75 1.0
1.1
V
1.15
0.5
-0.5
V
-1.2
II
Input current at maximum Except
input voltage
B0–B8
Except
B0–B8
IIH
High-level input current
B0 – B8
IIL
Low-level input current
IIH + IOZH
IIL + IOZL
IOS
Off-state I/O High current
Off-state I/O Low current
Short-circuit output
current 3
Except
B0–B8
B0 – B8
A0 – A8
A0 – A8
A0 – A8
only
VCC = MAX, VI = 0.0V or 5.5V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 1.9V
VCC = MAX, VI = 3.5V 5
VCC = MAX, VI = 0.5V
VCC = MAX, VI = 0.75V
VCC = MAX, VO = 2.7V
VCC = MAX, VO = 0.5V
VCC = MAX, VO = 0.0V
±50
µA
20
100
µA
100
mA
-20
µA
-100
50
µA
-50
µA
-45
-150 mA
ICC
Supply current (total)
An to Bn
Bn to An
Bn to An
ICCZ
Worst case
VCC = MAX, outputs Low or High
VCC = MAX, outputs Low
VCC = MAX, outputs High
VCC = MAX, outputs 3-State
VCC = MAX, all A and B outputs on
17
30
50
78
25
45
mA
28
50
50
78
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side.
5. For B port input voltage between 3 and 5 volts IIH will be greater than 100µA, but the parts will continue to function normally.
6. B0 – B8 clamps remain active for a minimum of 80ns following a High-to-Low transition.
1995 May 25
8

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