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AD568K Ver la hoja de datos (PDF) - Analog Devices

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AD568K Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
AD568
LSB
MSB
12 11 10 9
8
76
54
3
2
1
THRESHOLD 13
CONTROL
THRESHOLD
COMMON 14
LADDER 17
COMMON
PNP
CURRENT
SOURCES
PNP
SWITCHES
1.4V
BAND-
GAP
REF
AD568
THIN-FILM R-2R LADDER
(100 - 200)
DIFFUSED R-2R LADDER
(10 - 20)
2X 4X
BURIED
ZENER
REFERENCE
24 VCC
IOUT
IOUT
BIPOLAR
CURRENT
GENERATOR
18
22
ANALOG
VEE
COMMON
REFERENCE
23 COMMON
200
20 IOUT
19 LOAD RESISTOR
(RL)
21 BIPOLAR
OFFSET (IBPO)
15 10V SPAN
1kRESISTOR
16 10V SPAN
RESISTOR
PIN CONFIGURATION
Figure 1. Functional Block Diagram
ABSOLUTE MAXIMUM RATINGS1
VCC to REFCOM . . . . . . . . . . . . . . . . . . . . . . . . 0 V to +18 V
VEE to REFCOM . . . . . . . . . . . . . . . . . . . . . . . . . 0 V to –18 V
REFCOM to LCOM . . . . . . . . . . . . . . . . . +100 mV to –10 V
ACOM to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 100 mV
THCOM to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . ± 500 mV
SPANs to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 12 V
IBPO to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 5 V
IOUT to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . –5 V to VTH
Digital Inputs to THCOM . . . . . . . . . . . . . –500 mV to +7.0 V
Voltage Across Span Resistor . . . . . . . . . . . . . . . . . . . . . . 12 V
VTH to THCOM . . . . . . . . . . . . . . . . . . . . . . –0.7 V to +1.4 V
Logic Threshold Control Input Current . . . . . . . . . . . . . 5 mA
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mW
Storage Temperature Range
Q (Cerdip) Package . . . . . . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 175°C
Thermal Resistance
θJA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75°C/W
θJC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25°C/W
1Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Modell
ORDERING GUIDE
Package Option2
Temperature
Range ؇C
Linearity
Error Max
@ 25؇C
Voltage
Gain T.C.
Max ppm/؇C
AD568JQ
24-Lead Cerdip (Q-24) 0 to +70
± 1/2
± 50
AD568KQ
24-Lead Cerdip (Q-24) 0 to +70
± 1/4
± 30
AD568SQ
24-Lead Cerdip (Q-24) –55 to +125
± 1/2
± 50
NOTES
1For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices
Military Products Databook or current AD568/883B data sheet.
2Q = Cerdip.
Definitions
LINEARITY ERROR (also called INTEGRAL NONLINEAR-
ITY OR INL): Analog Devices defines linearity error as the
maximum deviation of the actual analog output from the ideal
output (a straight line drawn from 0 to FS) for any bit combina-
tion expressed in multiples of 1 LSB. The AD568 is laser
trimmed to 1/4 LSB (0.006% of FS) maximum linearity error at
+25°C for the K version and 1/2 LSB for the J and S versions.
DIFFERENTIAL LINEARITY ERROR (also called DIFFER-
ENTIAL NONLINEARITY or DNL): DNL is the measure of
the variation in analog value, normalized to full scale, associated
with a 1 LSB change in digital input code. Monotonic behavior
requires that the differential linearity error not exceed 1 LSB in
the negative direction.
MONOTONICITY: A DAC is said to be monotonic if the out-
put either increases or remains constant as the digital input
increases.
UNIPOLAR OFFSET ERROR: The deviation of the analog
output from the ideal (0 V or 0 mA) when the inputs are set to
all 0s is called unipolar offset error.
BIPOLAR OFFSET ERROR: The deviation of the analog out-
put from the ideal (negative half-scale) when the inputs are set
to all 0s is called bipolar offset error.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD568 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. A
–3–

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