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W14NK60Z(2005) Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza
componentes Descripción
Lista de partido
W14NK60Z Datasheet PDF : 17 Pages
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STP14NK60Z - STP14NK60ZFP - STB14NK60Z - STB14NK60Z-1 - STW14NK60Z
Table 3: Absolute Maximum ratings
Symbol
Parameter
VDS Drain-source Voltage (VGS = 0)
VDGR Drain-gate Voltage (RGS = 20 kΩ)
VGS Gate-source Voltage
ID
Drain Current (continuous) at TC = 25°C
ID
Drain Current (continuous) at TC = 100°C
IDM ( ) Drain Current (pulsed)
PTOT Total Dissipation at TC = 25°C
Derating Factor
VESD(G-S) Gate source ESD (HBM-C= 100pF, R= 1.5kΩ)
dv/dt (1) Peak Diode Recovery voltage slope
VISO Insulation Winthstand Voltage (DC)
Tj
Operating Junction Temperature
Tstg Storage Temperature
( ) Pulse width limited by safe operating area
(1) ISD 13.5A, di/dt 200 A/µs, VDD V(BR)DSS, Tj TJMAX.
(*) Limited only by maximum temperature allowed
Value
TO-220/D²PAK/I²PAK
TO-247
600
600
± 30
13.5
8.5
54
160
1.28
4000
4.5
--
TO-220FP
13.5 (*)
8.5 (*)
54 (*)
40
0.32
2500
-55 to 150
Table 4: Thermal Data
Rthj-case Thermal Resistance Junction-case Max
Rthj-amb Thermal Resistance Junction-ambient Max
Tl
Maximum Lead Temperature For Soldering Purpose
TO-220/D²PAK/I²PAK
TO-247
0.78
62.5
300
TO-220FP
3.1
50
Table 5: Avalanche Characteristics
Symbol
Parameter
IAR Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
EAS Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
Table 6: Gate-Source Zener Diode
Symbol
Parameter
Test Conditions
BVGSO Gate source Breakdown Igs= ± 1 mA (Open Drain)
Voltage
Max Value
12
300
Min.
30
Typ.
Max.
Unit
V
V
V
A
A
A
W
W/°C
V
V/ns
V
°C
Unit
°C/W
°C/W
°C
Unit
A
mJ
Unit
V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
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