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AD834AR Ver la hoja de datos (PDF) - Analog Devices

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Lista de partido
AD834AR
ADI
Analog Devices ADI
AD834AR Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Typical Performance Characteristics–AD834
1000
800
600
400
200
100
80
60
40
20
10
1
10
100
1000
FREQUENCY – MHz
TPC 1. Mean-Square Output
vs. Frequency
0
–10
–20
–30
–40
–50
X FEEDTHROUGH
–60
–70
–80
1
Y FEEDTHROUGH
10
100
FREQUENCY – MHz
1000
TPC 2. AC Feedthrough
vs. Frequency
0
–10
–20
–30
–40
X HARMONIC
DISTORTION
–50
–60
Y HARMONIC
–70
DISTORTION
–80
1M
10M
100M
1G
FREQUENCY – Hz
TPC 3. Total Harmonic Distortion
vs. Frequency
TPC 1 is a plot of the mean-square output versus frequency for
the test circuit of Figure 2. Note that the rising response is due
to package resonances.
For frequencies above 1 MHz, ac feedthrough is dominated by
static nonlinearities in the transfer function and the finite offset
voltages. The offset voltages cause a small fraction of the funda-
mental to appear at the output, and can be nulled out. See TPC 2.
THD data represented in TPC 3 is dominated by the second
harmonic, and is generated with 0 dBm input on the ac input
and 1 V on the dc input. For a given amplitude on the ac
input, THD is relatively insensitive to changes in the dc input
amplitude. Varying the ac input amplitude while maintaining
a constant dc input amplitude will affect THD performance.
WAVETEK 2500A
SIGNAL GENERATOR
LOW-PASS
FILTER
HP3362A
SIGNAL GENERATOR
A/B
A SWITCH B
X
W1 CH1
HP
AD834
54121A
CH2 SAMPLING
Y
W2
HEADS
DATA PRECISION 8200
VOLTAGE CALIBRATOR
HP54120A
DIGITIZING
MAINFRAME
HP330
COMPUTER
SUBTRACT
CH1–CH2
1024 POINT
FFT
Figure 1. Test Configuration for Measuring AC
Feedthrough and Total Harmonic Distortion
The squarer configuration shown in Figure 2 is used to deter-
mine wideband performance because it eliminates the need for
(and the response uncertainties of) a wideband measurement
device at the output. The wideband output of a squarer configu-
ration is a fluctuating current at twice the input frequency with a
mean value proportional to the square of the input amplitude.
By placing capacitors C3/C5 and C4/C6 across load resistors R1
and R2, a simple low-pass filter is formed, and the mean-square
value is extracted. The mean-square response can be measured
using a DVM connected across R1 and R2.
SMA FROM
HP8656A
SIGNAL
GENERATOR
SMA TO
HP436A
POWER
METER
L1
1H
8765
X2 X1 +VS W1
AD834
Y1 Y2 –VS W2
1234
R4
75
C1
0.1F
+5V
C3
C5
560pF 0.1F
C4
C6
560pF 0.1F
R1
49.9
TO
HP3456A
DVM
R2
49.9
C2
R3
0.1F
10
–5V
DENOTES A SHORT DIRECT CONNECTION TO THE GROUND PLANE
Figure 2. Bandwidth Test Circuit
+15V
+5V
0.1F
0.1F
X
IW1
8765
X2 X1 +VS W1
AD834
Y1 Y2 –VS W2
1234
Y
0.1F
IW2
–5V
AD707
A1
0.1F
–15V
1k
+15V
0.1F
AD707
A2
0.1F
NOTES
R1, R2 SHOULD BE PRECISION TYPE
–15V
RESISTOR (؎0.1%).
ABSOLUTE VALUE ERRORS OF R1, R2 WILL
1k
CAUSE A SCALE FACTOR ERROR.
R1, R2 MISMATCHES WILL BE EXPRESSED
AS LINEARITY ERRORS.
VOUT = IW1 R1 – UW2 R2
(IF R1 = R2, VOUT = >IW R1).
1k
+
VOUT
1k
Figure 3. Low-Frequency Test Circuit
REV. D
–5–

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