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ADL5390ACPZ-WP Datasheet PDF : 23 Pages
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ADL5390
Data Sheet
source being applied to the device. The 4.6 MHz pass band of
this filter is apparent in the subsequent spectral plots.
Figure 35 shows the output signal spectrum for a programmed
gain and phase of 5 dB and 45°. POUT is equal to 0 dBm and
VIBB = VQBB = 0.353 V (centered around 500 mV), that is ,
VIBBP − VIBBM = VQBBP − VQBBM = 0.353 V. Adjacent channel
power is measured in 30 kHz resolution bandwidth at 750 kHz
and 1.98 MHz carrier offset. Noise floor is measured at ±4 MHz
carrier offset in a 1 MHz resolution bandwidth.
REF LVL
5dBm
0.7dB OFFSET
0
–10
–20
–30
1AVG
–40
MARKER 1 [T1]
–14.38dBm
880.00755511MHz
RBW 30kHz
VWB 300kHz
SWT 2s
RF ATT 20dB
MIXER –10dBm
UNIT dB
1 [T1] –14.38dBm
880.00755511MHz
CH PWR
A
1
1 [T1]
–14.38dBm
880.00755511MHz
CH PWR 0.13dBm
ACP UP –62.00dB
ACP LOW –61.98dB
ALT1 UP –87.02dB
ALT1 LOW –87.04dB
1RM
–50
EXT
–60
–70
Cl2
–80
Cl2
–90
–100
CENTER 880MHz
C0
Cl1
Cl1
C0
CU1
CU1
500kHz/
CU2
CU2
SPAN 5MHz
Figure 35. Output Spectrum, Single-Carrier CDMA2000 Test Model at −5 dBm,
VI = VQ = 0.353 V, ACP Measured at 750 kHz and 1.98 MHz Carrier Offset,
Input Signal–Filtered Using a Cavity-Tuned Filter (Pass Band = 4.6 MHz)
Holding the I and Q gain control voltages steady at 0.353 V,
input power was swept. Figure 36 shows the resulting output
power, noise floor, and adjacent channel power ratio. The noise
floor is presented as noise in a 1 MHz bandwidth as defined by
the 3GPP2 specification.
–30
–30
–40
–40
–50
–50
ACP: 750kHz OFFSET, 30kHz RBW
–60
–60
–70
–70
ACP: 1.98MHz OFFSET, 30kHz RBW
–80
–80
–90
NOISE: 4MHz OFFSET, 1MHz RBW
–100
–30
–25
–20
–15
–10
–5
0
OUTPUT POWER (dBm)
–90
–100
5
Figure 36. Noise and ACP vs. Output Power, Single-Carrier CDMA2000 Test
Model, VI = VQ = 0.353, ACP Measured in 30 kHz RBW at ±750 kHz and
±1.98 MHz Carrier Offset, Noise Measured at ±4 MHz Carrier Offset
ACP is still in compliance with the standard (<−45 dBc at
750 kHz and <−60 dBc at 1.98 MHz) even with output powers
greater than +3 dBm. At low output power levels, ACP at
1.98 MHz carrier offset degrades as the noise floor of the
ADL5390 becomes the dominant contributor to measured ACP.
Measured noise at 4 MHz carrier offset begins to increase
sharply above 2 dBm output power. This increase is not due to
noise, but results from increased carrier-induced distortion. As
output power drops below 2 dBm, the noise floor drops towards
−90 dBm.
With a fixed input power of 2.16 dBm, the output power was
again swept by changing VIBB and VQBB from 0 V to 500 mV.
The resulting output power, ACP, and noise floor are shown in
Figure 37.
5
–30
VOUT vs. VIBB/VQBB
–2
–40
–9
–50
ACP: 750kHz OFFSET, 30kHz RBW
–16
–60
–23
–70
ACP: 1.98MHz OFFSET, 30kHz RBW
–30
–80
–37
–90
NOISE: 4MHz OFFSET, 1MHz RBW
–44
0
–100
0.1
0.2
0.3
0.4
0.5
VI(Q)BB
Figure 37. Output Power, Noise, and ACP vs. I and Q Control Voltages,
CDMA2000 Test Model, VI = VQ, ACP Measured in 30 kHz RBW at ±750 MHz
and ±1.98 MHz Carrier Offset, Noise Measured at ±4 MHz Carrier Offset
In contrast to Figure 36, Figure 37 shows that for a fixed input
power, ACP remains fairly constant as gain and phase are
changed (this is not true for very high RF input powers) until
the noise floor of the ADL5390 becomes the dominant
contributor to the measured ACP.
Rev. A | Page 16 of 23
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