82093AA (IOAPIC)
E
6.0. TESTABILITY
The purpose of this section is to explain the test modes that the Stand Alone IOAPIC device will support. There
are four test modes available in this device.
1. Tri-state all the outputs
2. Drive 1’s to the outputs
3. Drive 0’s to the outputs
4. Nand Tree
The Nand Tree and Tri-state mode are also valuable to the board testing environment. The Nand Tree can
identify opens and shorts on input and output pins and the Tri-State mode can give the ATE tester control over
other devices in the system.
The test modes are decoded from the INTIN inputs (INTIN21:17) qualified with the TESTIN# pin. Test mode
selection is asynchronous. The following test modes are used:
Table 5. IOAPIC Test Modes
Test Modes
INTIN 21:17
NAND Tree
x1xxx
xxx1x
Tristate All Outputs
00000
Drive Outputs High
00101
Drive Outputs Low
00100
Drive Outputs Low
00100
6.1. Tri-State Of All Output Pins
This mode is useful during ATE testing at a board level. If the IOAPIC tri-states its outputs, the tester can drive
the signals without having to overdrive the IOAPIC output buffers. This mode is enabled in two ways:
1. Asserting the RESET pin. During RESET, all the IOAPIC device outputs are Tri-State
2. TESTIN# = 0 and INTIN(21:17) = 00000
6.2. Drive 1’s to all the output pins
This is a special test mode that enables all the outputs are driving logic ones. How to enable this mode:
1. TESTIN# = 0
2. INTIN(21:17) = 00101
3. All the outputs will be driven to 1
18
PRELIMINARY