RTM875N-397 Ver la hoja de datos (PDF) - Realtek Semiconductor

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RTM875N-397

AC Performance Measurement Report

Realtek Semiconductor 

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RTM875N-397 AC Performance Measurement Report

Measurement Equipment :

Clock Rise Time / Fall Time Are Measured by Tektronix® 6804B with Single-ended

Probe

- Mainframe with 8.0GHz Bandwidth

- Mainframe with 20GS/s Sampling Rate

- P7240 Active Probe with 4.0GHz Bandwidth (input: 1.0pF / 20K-ohm)

Clock Jitter & Duty Cycle Are Measured by Tektronix® 6804B with Differential Probe

- P7330 Differential Active Probe with 3.5GHz Bandwidth (input: 0.5pF / 100K-ohm)

- Tektronix® Jitter Analysis 3® Jitter Measurement Software

Measurement Environment :

- Test board

Measurement Item :

Differential Clock

- Slew_Rise & Slew_Fall

- Vcross & ΔVcross

- Cycle to Cycle jitter

- Vmax & Vmin

- Duty Cycle

Single-end Clock

- Slew_Rise & Slew_Fall

- Duty Cycle

- Cycle to Cycle jitter

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Measurement Summary

From the measurement shown as follows, RTM875N-397 works good and meets all CLK Spec.

Measurement Signal:

1.CPU0 CLOCK

4.PCIE6 CLOCK

7.PCI CLOCK

10.Phase jitter

2. CPU1 CLOCK

5.PCIE11 CLOCK

8.USB CLOCK

3.SATA CLOCK

6. DOT96 CLOCK

9. REF CLOCK

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