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IRHE3110 Datasheet PDF : 12 Pages
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PRraed-iIartriaodniaCthioanracteristics
IRHE7110
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ➄➅
Parameter
100K Rads(Si)1
300 - 1000K Rads (Si) Units
Min Max Min Max
Test Conditions
BVDSS Drain-to-Source Breakdown Voltage 100
VGS(th) Gate Threshold Voltage
2.0
IGSS
Gate-to-Source Leakage Forward —
IGSS
Gate-to-Source Leakage Reverse —
IDSS
Zero Gate Voltage Drain Current
RDS(on) Static Drain-to-Source
On-State Resistance (TO-3)
RDS(on) Static Drain-to-Source
On-State Resistance (LCC-18)
VSD
Diode Forward Voltage
4.0
100
-100
25
0.60
0.60
1.5
100
1.25
—V
4.5
— 100 nA
— -100
— 25 µA
— 0.80
— 0.80
— 1.5 V
VGS = 0V, ID = 1.0mA
VGS = VDS, ID = 1.0mA
VGS = 20V
VGS = -20 V
VDS=80V, VGS =0V
VGS = 12V, ID =2.2A
VGS = 12V, ID =2.2A
VGS = 0V, IS = 3.5A
1. Part numbers IRHE7110
2. Part number IRHE3110, IRHE4110, IRHE8110
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Single Event Effect Safe Operating Area
Ion
LET
Energy Range
VDS(V)
MeV/(mg/cm2)) (MeV)
(µm) @VGS=0V @VGS=-5V@VGS=-10V@VGS=-15V@VGS=-20V
Cu
28
285
43
100
100
100
80
60
Br
36.8
305
39
100
90
70
50
120
100
80
Cu
60
Br
40
20
0
0
-5
-10
-15
-20
-25
VGS
Fig a. Single Event Effect, Safe Operating Area
For footnotes refer to the last page
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