FQB8P10TM(2013) Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Lista de partido
FQB8P10TM Datasheet PDF : 8 Pages
| |||
Same Type
VGS
50KΩ
12V
200nF
as DUT
Qg
300nF
VGS
VDS
Qgs
Qgd
IG = const.
DUT
Charge
Figure 12. Gate Charge Test Circuit & Waveform
VDS
VGS
RG
RL
VDD
t on
td(on)
tr
VGS 10%
t off
td(off)
tf
VGS
DUT
VDS
90%
Figure 13. Resistive Switching Test Circuit & Waveforms
L
VDS
EAS =
--1--
2
L IAS2
BVDSS
--------------------
BVDSS - VDD
tp
Time
ID
RG
VGS
tp
DUT
VDD
VDD
IAS
BVDSS
ID (t)
VDS (t)
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
©2000 Fairchild Semiconductor Corporation
5
FQB8P10 Rev. C1
www.fairchildsemi.com
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