FM25V01A Ver la hoja de datos (PDF) - Cypress Semiconductor

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FM25V01A

128-Kbit (16K × 8) Serial (SPI) F-RAM

Cypress Semiconductor 

FM25V01A

Data Retention and Endurance

Parameter

Description

TDR

Data retention

NVC

Endurance

Test condition

TA = 85 C

TA = 75 C

TA = 65 C

Over operating temperature

Min

10

38

151

1014

Max

Unit

–

Years

–

–

–

Cycles

Capacitance

Parameter [5]

Description

CO

Output pin capacitance (SO)

CI

Input pin capacitance

Thermal Resistance

Test Conditions

TA = 25 C, f = 1 MHz, VDD = VDD(typ)

Parameter

JA

JC

Description

Thermal resistance

(junction to ambient)

Thermal resistance

(junction to case)

Test Conditions

Test conditions follow standard test methods and

procedures for measuring thermal impedance,

per EIA / JESD51.

AC Test Conditions

Input pulse levels .................................10% and 90% of VDD

Input rise and fall times ...................................................3 ns

Input and output timing reference levels ................0.5 × VDD

Output load capacitance .............................................. 30 pF

Max

8

6

8-pin SOIC

146

48

Unit

pF

pF

Unit

C/W

C/W

Note

5. This parameter is periodically sampled and not 100% tested.

Document Number: 001-90881 Rev. *E

Page 14 of 22

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