datasheetbank_Logo
búsqueda de Hoja de datos y gratuito Fichas de descarga
HOME  >>>  Intersil  >>> 5962F9672101VXC PDF

5962F9672101VXC Hoja de datos - Intersil

5962F9672101VXC image

Número de pieza
5962F9672101VXC

Other PDF
  no available.

PDF
DOWNLOAD     

page
4 Pages

File Size
488.7 kB

Fabricante
Intersil
Intersil Intersil

Description
The Intersil ACTS630MS is a Radiation Hardened 16-bit parallel error detection and correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The check word is stored with the data word during a memory write cycle; during a memory read cycle a 22-bit word is taken form memory and checked for errors. Single bit errors in the data words are flagged and corrected. Single bit errors in check words are flagged but not corrected. The position of the incorrect bit is pinpointed, in both cases, by the 6-bit error syndrome code which is output during the error correction cycle.


FEATUREs
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96721 and Intersil’s QM Plan
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ)
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg
• Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse
• Dose Rate Survivability. . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55°C to +125°C
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
    - VIL = 0.8V Max
    - VIH = VCC/2 Min
• Input Current ≤ 1µA at VOL, VOH
• Fast Propagation Delay . . . . . . . . . . . . . . . . 37ns (Max), 24ns (Typ)

Page Link's: 1  2  3  4 

Número de pieza
componentes Descripción
PDF
Fabricante
Radiation Hardened EDAC (Error Detection and Correction)
Ver
Renesas Electronics
Radiation Hardened EDAC (Error Detection and Correction Circuit)
Ver
Intersil
16-Bit Feedthrough Error Detection & Correction Unit (EDAC)
Ver
Dynex Semiconductor
16–Bit Flow–Through EDAC Error Detection And Correction unit
Ver
Atmel Corporation
16–Bit Flow–Through EDAC Error Detection And Correction unit ( Rev : 1997 )
Ver
Atmel Corporation
16–Bit Flow–Through EDAC Error Detection And Correction unit
Ver
Atmel Corporation
ERROR DETECTION/CORRECTION CIRCUIT ( Rev : 1998 )
Ver
Micrel
ERROR DETECTION/CORRECTION CIRCUIT
Ver
Micrel
ERROR DETECTION/ CORRECTION CIRCUIT
Ver
Motorola => Freescale
ERROR DETECTION/ CORRECTION CIRCUIT
Ver
ON Semiconductor

Share Link: GO URL

EnglishEnglish Korean한국어 Chinese简体中文 Japanese日本語 Russianрусский

All Rights Reserved© datasheetbank.com  [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]