Description
74ALS00 provides x4 independent 2-input NAND gates performing the Boolean function Y = A • B or Y = A + B. The device is fabricated using a 1.5µm 40V Bipolar process. Internal circuitry comprises of 3 stages and includes buffered outputs for high noise immunity and stability. All inputs are equipped with protection circuits against static discharge and transient excess voltage.

FEATUREs:
◾ High speed – 3ns (Min) propagation delay
◾ Direct drop-in replacement for obsolete
   components in long term programs.

Supply Formats:
◾ Default – Die in Waffle Pack (300 per tray capacity)
◾ Sawn Wafer on Tape – On request
◾ Unsawn Wafer – On request
◾ Die Thickness <> 350µm(14 Mils) – On request
◾ Assembled into Ceramic Package – On request