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74F269 Datasheet PDF : 19 Pages
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NXP Semiconductors
74F269
8-bit bidirectional binary counter
9. Static characteristics
Table 6. Static characteristics
Symbol Parameter
Conditions
Min
VIK
input clamping voltage VCC = 4.5 V; IIK = −18 mA
−1.2
VOH
HIGH-level output
VCC = 4.5 V; VI = VIL or VIH
voltage
VCC = ±10 %; IOH = −1 mA
-
VCC = ±5 %; IOH = −1 mA
-
VOL
LOW-level output
voltage
VCC = 4.5 V; IOL = 20 mA;
VI = VIL or VIH
VCC = ±10 %
-
VCC = ±5 %
-
II
input leakage current VCC = 5.5 V; VI = 7.0 V
-
IIH
HIGH-level input current VCC = 5.5 V; VI = 2.7 V
-
IIL
LOW-level input current VCC = 5.5 V; VI = 0.5 V
-
IO
output current
VCC = 5.5 V
[2] -
ICC
supply current
PE = CET = CEP = U/D = GND;
VCC = 5.5 V; CP = rising edge
Dn: VI = 4.5 V
-
Dn: VI = GND
-
25 °C
Typ[1]
−0.73
-
3.4
0.30
0.30
-
-
-
-
93
98
Max
-
-
-
-
-
-
-
-
-
-
-
−40 °C to +85 °C Unit
Min
Max
−1.2
-V
2.5
-V
2.7
-V
-
0.50 V
-
0.50 V
-
100 μA
-
20 μA
-
−0.6 mA
−60 −150 mA
-
120 mA
-
125 mA
[1] All typical values are measured at VCC = 5 V.
[2] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
10. Dynamic characteristics
Table 7. Dynamic characteristics
GND = 0 V; for test circuit, see Figure 13.
Symbol Parameter
Conditions
tPLH
LOW to HIGH
CP to Qn; load; PE = LOW; see Figure 7
propagation delay CP to Qn; count; PE = HIGH; see Figure 7
CP to TC; see Figure 7
CET to TC; see Figure 8
U/D to TC; see Figure 9
tPHL
HIGH to LOW
CP to Qn; load; PE = LOW; see Figure 7
propagation delay CP to Qn; count; PE = HIGH; see Figure 7
CP to TC; see Figure 7
CET to TC; see Figure 8
U/D to TC; see Figure 9
25 °C; VCC = 5.0 V 0 °C to 70 °C; Unit
VCC = 5.0 V ± 0.5 V
Min Typ Max Min
Max
3.0 6.0 8.5 3.0
9.0 ns
3.0 6.0 9.0 3.0
10.0 ns
4.5 6.5 9.5 4.0
10.5 ns
3.5 6.0 9.0 3.0
10.0 ns
4.5 7.0 9.0 4.0
10.0 ns
4.0 6.5 8.5 4.0
9.0 ns
4.5 7.0 10.0 4.0
10.5 ns
5.0 6.5 9.5 5.0
10.0 ns
3.0 6.5 9.0 3.0
10.0 ns
4.5 7.0 9.5 4.0
10.0 ns
74F269_5
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 05 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
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