Philips Semiconductors
Memory controller
Preliminary specification
SAA4951
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
VDD
VI
Tamb
Tstg
PARAMETER
supply voltage
input voltage
operating ambient temperature
storage temperature
MIN.
−0.5
−0.5
0
−40
MAX.
+6.0
VDD + 0.5
+70
+125
UNIT
V
V
°C
°C
CHARACTERISTICS
Recommended operating conditions
SYMBOL
VDD
VI
VO
IDD
Tamb
Tj
PARAMETER
DC supply voltage
DC input voltage
DC output voltage
supply current
operating ambient temperature
junction temperature
MIN.
4.5
−0.5
−0.5
−
0
0
TYP.
5.0
−
−
50
−
−
MAX.
5.5
VDD+0.5
VDD+0.5
−
70
140
UNIT
V
V
V
mA
°C
°C
DC Characteristics
SYMBOL
PARAMETER
Tamb = +25 °C
MIN.
MAX.
vIH
TTL-input
2.0
−
HIGH level input voltage 2.0
VIL
TTL-input
−
0.8
LOW level input voltage
0.8
VOH
HIGH level output voltage 4.4
−
5.4
3.1
VOL
LOW level output voltage −
0.1
0.1
0.27
ILI
input leakage current
−
±1.0
Rpull
internal pull-up resistor
42
150
for I/O cells
35
105
UNIT VDD
(V)
V
4.5
5.5
V
4.5
5.5
V
4.5
5.5
4.5
V
4.5
5.5
4.5
µA
5.5
kΩ 4.5
5.5
TEST CONDITIONS
VI
(V)
−
OTHER
−
−
−
VIH or VIL
VIH or VIL
VDD or VSS
−
I0 = −2 µA
I0 = −2 µA
I0 = −4.0 mA/
8.0 mA (SRC)
I0 = +2 µA
I0 = +2 µA
I0 = −4.0 mA/
8.0 mA (SRC)
−
−
April 1994
20