WSE128K16-35G2TC Ver la hoja de datos (PDF) - Unspecified
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WSE128K16-35G2TC Datasheet PDF : 15 Pages
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WSE128K16-XXX
SRAM AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C to +125°C)
Parameter
Symbol
Read Cycle
Read Cycle Time
tRC
Address Access Time
tAA
Output Hold from Address Change
tOH
Chip Select Access Time
tACS
Output Enable to Output Valid
tOE
Chip Select to Output in Low Z
tCLZ1
Output Enable to Output in Low Z
tOLZ1
Chip Disable to Output in High Z
tCHZ1
Output Disable to Output in High Z
tOHZ1
1. This parameter is guaranteed by design but not tested.
-35
Min
Max
35
35
0
35
20
3
0
20
20
-45
Min
Max
45
45
0
45
25
3
0
20
20
SRAM AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C to +125°C)
Parameter
Symbol
Write Cycle
Write Cycle Time
tWC
Chip Select to End of Write
tCW
Address Valid to End of Write
tAW
Data Valid to End of Write
tDW
Write Pulse Width
tWP
Address Setup Time
tAS
Address Hold Time
tAH
Output Active from End of Write
tOW1
Write Enable to Output in High Z
tWHZ1
Data Hold Time
tDH
1. This parameter is guaranteed by design but not tested.
-35
Min
Max
35
25
25
20
25
0
0
4
20
0
-45
Min
Max
45
30
30
25
30
0
0
4
25
0
-70
Min
Max
70
70
3
70
35
3
0
25
25
-70
Min
Max
70
60
60
30
50
5
5
5
25
0
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
FIG. 3
AC TEST CIRCUIT
I OL
Current Source
D.U.T.
Ceff = 50 pf
I OH
Current Source
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
VZ ≈ 1.5V
(Bipolar Supply)
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
4
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