JANTX2N6806 Ver la hoja de datos (PDF) - TE Connectivity
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JANTX2N6806 Datasheet PDF : 20 Pages
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MIL-PRF-19500/562C
4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table IV of MIL-PRF-19500 and as
specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I
herein shall not be acceptable.
Screen (see table IV of
MIL-PRF-19500)
1/
1/
2/
3
9
1/
10
11
12
13
Measurement
JANS level
Gate stress test (see 4.5.5)
Method 3161 (see 4.5.3)
Method 3470 (optional)
Test condition G
IGSS1, IDSS1,
Subgroup 2 of table I herein.
Method 1042, test condition B
IGSS1, IDSS1, rDS(on)1, VGS(th)1, subgroup 2 of
table I herein;
∆IGSS1 = ± 20 nA dc or ± 100 percent of initial
value, whichever is greater.
∆IDSS1 = ± 25 µA dc or ± 100 percent of initial
value, whichever is greater.
Method 1042, test condition A, t = 240 hours
Subgroups 2 and 3 of table I herein;
∆IGSS1 = ± 20 nA dc or ±100 percent of initial
value, whichever is greater.
∆IDSS1 = ± 25 µA dc or ± 100 percent of initial
value, whichever is greater.
∆rDS(on)1 = ± 20 percent of initial value.
∆VGS(th)1 = ± 20 percent of initial value.
JANTX and JANTXV levels
Gate stress test (see 4.5.5)
Method 3161 (see 4.5.3)
Method 3470 (optional)
Test condition G
Subgroup 2 of table I herein.
Method 1042, test condition B
IGSS1, IDSS1, rDS(on)1, VGS(th)1, subgroup 2 of
table I herein;
Method 1042, test condition A; TA = + 175EC
and t = 48 hours
Subgroups 2 of table I herein;
∆IGSS1 = ± 20 nA dc or ±100 percent of initial
value, whichever is greater.
∆IDSS1 = ± 25 µA dc or ± 100 percent of initial
value, whichever is greater.
∆rDS(on)1 = ± 20 percent of initial value.
∆VGS(th)1 = ± 20 percent of initial value.
1/ Shall be performed anytime before screen 10.
2/ Method 3470 is optional if performed as a sample in group A, subgroup 5.
4.3.1 Screening (JANHC and JANKC). Screening of die shall be in accordance with MIL-PRF-19500. As a minimum, die shall be
100-percent probed in accordance with group A, subgroup 2.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500. Alternate flow is allowed for
quality conformance inspection in accordance with figure 4 of MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein. Electrical
measurements (end-points) shall be in accordance with subgroup 2 of table I herein
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in
table VIa (JANS) and table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and herein. Electrical measurements (end-points) shall
be in accordance with subgroup 2 of table I herein.
7
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